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TAI Ren-Zhong. X-ray physics[J]. PHYSICS, 2021, 50(8): 501-511. DOI: 10.7693/wl20210802
Citation: TAI Ren-Zhong. X-ray physics[J]. PHYSICS, 2021, 50(8): 501-511. DOI: 10.7693/wl20210802

X-ray physics

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  • Received Date: July 22, 2021
  • Published Date: August 11, 2021
  • With the development of advanced X-ray sources such as synchrotron radiation and free electron lasers,X-ray techniques are becoming more and more important as an analytical tool for advancing the frontiers of scientific research. This paper will first describe the interaction between X-rays and matter, then briefly review how X-ray methods work for detecting different physical properties, such as analyzing local, crystal, nanoscale, surface, interface and electron structures. The opportunities in the future, more advanced X-ray sources will bring for research will also be assessed.
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