The use of synchrotron radiation x-ray fluorescence inmicroelemental analysis in plants
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Abstract
Synchrotron radiation (SR) X-ray fluorescence (XRF) and X-ray spectra excited by electron and proton beams are compared. The XRF data acquisition and processing, mainly by energy dispersion, are described. The principle of standardless quantitative analysis (basic parameter method) is explained. The SR-XRF trace analysis results obtained from several plants are shown.
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