Recent progress of atomic force microscopy

Atomic force microscopy (AFM) is one of the key techniques for real-space imaging and structure characterization at the micro- and nanometer scale, and many remarkable new functions and techniques have been developed in recent years. Two special areas will be presented here: the various detection modes of AFM and their applications in the nanoscale research and measurement of physical properties, and the development of AFM techniques and their applications in basic and applied science. A brief comment will also be given on the further development of AFM probe techniques and their expanding application areas.