Low energy/photoemission electron microscopy

PHYSICS > 2010 > 39(03): 211-218.

Low energy/photoemission electron microscopy[J]. PHYSICS, 2010, 39(03): 211-218.

Citation:

Low energy/photoemission electron microscopy[J]. PHYSICS, 2010, 39(03): 211-218.

Citation:

Low energy/photoemission electron microscopy[J]. PHYSICS, 2010, 39(03): 211-218.

Abstract

The rapidly developing field of low energy and photoemission electron microscopy (LEEM/PEEEM) is reviewed. This technology combines microscopy, spectroscopy and diffraction in one system, which allows a comprehensive characterization of the specimen under study. The combination of LEEM/PEEM and soft X-rays in a synchrotron radiation facility is especially powerful for studies in surface science and nano-technology.

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