Low energy/photoemission electron microscopy

The rapidly developing field of low energy and photoemission electron microscopy (LEEM/PEEEM) is reviewed. This technology combines microscopy, spectroscopy and diffraction in one system, which allows a comprehensive characterization of the specimen under study. The combination of LEEM/PEEM and soft X-rays in a synchrotron radiation facility is especially powerful for studies in surface science and nano-technology.