Fluorescence micro－tomography with synchrotron radiation and its applications

A novel form of microanalysis, X－ray fluorescence computed micro－tomography with synchrotron radiation is being developed. By combining x－ray fluorescence with tomographic techniques, the element distribution inside a sample in an arbitrary virtual section can be obtained without the need of invasive sample preparation. This technique,which is playing an increasing role in microanalysis, its applications and future prospects will be reviewed.