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ELECTRON BEAM ION TRAPS AND HIGHLY CHARGED ION RELEVANT PHYSICS[J]. PHYSICS, 2003, 32(02).
Citation: ELECTRON BEAM ION TRAPS AND HIGHLY CHARGED ION RELEVANT PHYSICS[J]. PHYSICS, 2003, 32(02).
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ELECTRON BEAM ION TRAPS AND HIGHLY CHARGED ION RELEVANT PHYSICS

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  • A brief introduction to the historical background and current status of electron beam ion traps (EBITs) is presented. The structure and principles of an EBIT for producing highly charged ions are described. Finally, EBITs as a potential tool in hot-plasma diagnostics and in studying frontier problems of highly charged ion physics are discussed.
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