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TANG Feng, WAN Xian-Gang. Efficient topological materials discovery using symmetry indicators[J]. PHYSICS, 2019, 48(6): 341-356. DOI: 10.7693/wl20190601
Citation: TANG Feng, WAN Xian-Gang. Efficient topological materials discovery using symmetry indicators[J]. PHYSICS, 2019, 48(6): 341-356. DOI: 10.7693/wl20190601

Efficient topological materials discovery using symmetry indicators

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  • Received Date: May 24, 2019
  • Published Date: June 11, 2019
  • Over the past decade, topological materials——in which the topology of electron bands in the bulk material leads to robust, unconventional surface states and electromagnetism——have attracted much attention. With the development of the theoretical methods,recently there have been many advancements on searching for topological materials in a large scale. Very recently, based on symmetry-indicator theory and using so-called atomic insulator basis, we develop a theoretical method for systematically discovering topological materials. In this paper, we introduce our algorithm, and we also discuss several typical topological materials. The predicted thousands of topological materials provide a platform for further study on topological materials next step.
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