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李建奇. 高分辨电子显微学的新进展——走向亚埃电子显微时代[J]. 物理, 2006, 35(02): 147-150.
引用本文: 李建奇. 高分辨电子显微学的新进展——走向亚埃电子显微时代[J]. 物理, 2006, 35(02): 147-150.
Recent developments in high-resolution electron microscopy——Sub-Angstrom electron microscopy era in sight[J]. PHYSICS, 2006, 35(02): 147-150.
Citation: Recent developments in high-resolution electron microscopy——Sub-Angstrom electron microscopy era in sight[J]. PHYSICS, 2006, 35(02): 147-150.

高分辨电子显微学的新进展——走向亚埃电子显微时代

Recent developments in high-resolution electron microscopy——Sub-Angstrom electron microscopy era in sight

  • 摘要: 简要介绍了高分辨电子显微学的最新进展.特别指出,随着空间分辨率突破1和亚埃分辨率的电子显微镜的快速普及,电子显微学及相关研究领域将进入一个快速发展的阶段.装备有球差校正器和能量单色器的新一代电子显微镜将很快进入实验室,给出高质量的原子结构图像(分辨率优于 1)和高能量分辨率的电子能量损失谱(优于 0.1eV).这一进展将对晶体结构学、材料科学、物理学、纳米科学及生命科学产生重大影响,也为解决很多重要结构问题提供新机遇.

     

    Abstract: Recent remarkable progress in the field of sub-Angstrom high-resolution electron microscopy (HRTEM) is briefly reviewed. In particular, it is shown that numerous important structural issues can now be studied with the arrival of this kind of advanced HRTEM in laboratories. Sub-angstrom HRTEM could significantly promote the development of crystallography, material science, physics, nano-materials and biology. The typical new generation HRTEM facility, equipped with Cs-corrector and monochromator, will give us high-quality atomic HRTEM images with a resolution better than 1, and also high resolution electron energy loss spectra with a resolution better than 0.1eV.

     

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