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肖旭东, 王 兵, 鲁 山, 杨金龙, 侯建国. 纳米隧道结的量子电容现象[J]. 物理, 2002, 31(04).
引用本文: 肖旭东, 王 兵, 鲁 山, 杨金龙, 侯建国. 纳米隧道结的量子电容现象[J]. 物理, 2002, 31(04).
Quantum capacitance of a nanojunction[J]. PHYSICS, 2002, 31(04).
Citation: Quantum capacitance of a nanojunction[J]. PHYSICS, 2002, 31(04).

纳米隧道结的量子电容现象

Quantum capacitance of a nanojunction

  • 摘要: 利用STM针尖和二维Au纳米团簇构造的双隧道结,通过对单电子隧穿谱的测量,研究了纳米隧道结的电容随隧道结宽度的变化,发现电容随结宽度的变化偏离了经典电容的行为,为纳米隧道结的量子电容效应提供了实验证据.

     

    Abstract: The capacitance of a nanojunction fromed by a scanning tunneling microscope (STM) tip and a two-dimensional gold cluster was measured through single electron tunneling spectroscopy of a double-barrier tunnel junction. By decreasing the STM tip-cluster separation, it was observed that the capacitance first increased and then decreased at short separation. This differs from classical behavior and provides evidence of quantum effects of the capacitance.

     

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